New Microcredential: Practical Aspects of Electron Microscopy

Electron microscopy has been widely used for microstructural and chemical analysis of materials from milimetre down to atomic length scales. This course specifically covers the practical aspects of electron microscopy, including scanning/transmission electron microscopy (S/TEM), scanning electron microscopy (SEM) and focused ion beam (FIB), electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS). Participants will learn the hands-on operations of scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS). This intensive, hands-on course is open to graduate students with a bachelor’s degree in engineering or science. Participants will engage in experiential learning at the Ontario Centre for the Characterization of Advanced Materials (OCCAM).